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Du et al. Satell Navig             (2021) 2:3                                         Page 17 of 22





            Example 2: Comparison between two kinds of Chi‑square
            test statistics
            In this example two kinds of Chi-square test statis-
            tics were compared. Te frst one, referred to as the
            “Observation Consistency Test (OCT)” in Wieser
            (2004), is based on the post-ft measurement residuals
            only. Te second one, referred to as the “Local Overall
            Model (LOM)” test in Teunissen (1990), is based on the
            post-ft residuals and states corrections, i.e. diferences
            between the estimated and the predicted states. Te
            same dataset as in example 1 was used; however, this
            time the authors simulated six faults in the predicted
            state vector, specifcally the predicted coordinates, i.e.
            assuming a miss-modelling of the dynamic process,
            where these coordinates were obtained with code-
            based positioning. Te simulated faults were injected to   Fig. 7  PPP positioning errors (after convergence) in the case of faulty
            diferent components, i.e. X, Y and Z, from epoch 2 500   predicted states, with no FDE applied
            to 2 750, and had the same magnitude of 1 m but with
            diferent signs. Te positioning errors without FDE are
            shown in Fig. 7.                                  detected with LOM, while none were detected with OCT,
                                                              indicating that the OCT test statistics are less powerful
              Illustrated in Fig. 8a and b are the Chi-square test sta-  than LOM (for this case).
            tistics based on OCT and LOM, respectively. As is seen
            from the fgure, all the simulated faults were successfully


































              Fig. 8  OCT and LOM Chi‑square test statistics for fault detection; equations from (Teunissen 1990) and (Wieser 2004) was adopted; code and
              carrier‑phase measurements were processed together to compute these test statistics; P  = 0.01
                                                                      FA
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