Page 78 - 《真空与低温》2025年第3期
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第  31 卷    第  3 期                          真空与低温
                 2025 年 5 月                           Vacuum and Cryogenics                                349



                         加  热   电   流   对  六   硼   化   镧  阴   极   场   发   射  特   性   影   响  研   究



                                     苟明楷 ,黄 凯 ,陈程成 ,赵 鹏 ,唐 帅 ,邓少芝                      1
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                 (1. 中山大学电子与信息工程学院(微电子学院)  光电材料与技术国家重点实验室  广东省显示
                 材料与技术重点实验室,广州 510275;2. 中国电子产品可靠性与环境试验研究所,广州 511370)
                     摘要:与热阴极和肖特基阴极相比,场发射阴极有响应快、电流密度大、能散低等优势,但存在电流不稳定的
                  缺点。在发射过程中保持高温是提升稳定性的一种有效方法,但温度升高也会改变冷阴极电子发射特性,因此研
                  究不同加热电流对冷阴极发射特性的影响对于实际应用具有重要意义。采用聚焦等离子体刻蚀方法制备了六硼
                  化镧纳米锥电子源,并在不同加热温度下对其发射特性进行了研究。通过                          COMSOL Multiphysics 仿真获得了阴极
                  在不同加热电流下的温度,并在不同的加热温度下开展了场发射实验研究,实验结果表明,随着加热电流增大,温
                  度升高,场发射稳定性会显著提升。通过计算发现,由于本实验中最高加热电流对应的温度约为                                   1 000 K,其发射
                  机制为场发射,从而仍然能保持低能散和高亮度。该工作将对获取稳定发射的高性能冷阴极点电子源起指导作用。
                     关键词:电子源;场发射;冷阴极;六硼化镧;加热电流;稳定性
                     中图分类号:TB79                      文献标志码:A       文章编号:1006−7086(2025)03−0349−05
                     DOI:10.12446/j.issn.1006-7086.2025.03.009

                     Study on the Effect of Heating Current on the Emission Characteristics of LaB 6  Cold Cathode


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                        GOU Mingkai ,HUANG Kai ,CHEN Chengcheng ,ZHAO Peng ,TANG Shuai ,DENG Shaozhi  1
                   (1. State Key Laboratory of Optoelectronic Materials and Technologies,Guangdong Province Key Laboratory of
                  Display Material and Technology,School of Electronics and Information Technology (School of microelectronics),
                          Sun Yat-sen University,Guangzhou 510275,China;2. China Electronic Product Reliability and
                                  Environmental Testing Research Institute,Guangzhou 511370,China)
                     Abstract:Compared with thermionic and Schottky cathodes,field emission cold cathodes have the advantages of fast
                  response,high current density and low energy spread,which are beneficial for the high resolution and high signal-to-noise ra-
                  tio for imaging. However,the emission current of cold cathode is not stable due to the varied surface caused by the gas ad-
                  sorption and desorption. The varying surface with a varied work function results in a fluctuation and decay of the current and
                  the only commercial tungsten field emission source still has a fluctuation of 5%/h and rapid decay of 20%/10 h even under a
                               −9
                  high vacuum of 10  Pa. Increasing operation temperature can reduce the adsorption of gases on the cathode surface. Main-
                  taining high temperature during the emission process is an effective way to improve the stability,but higher operation temper-
                  ature will also change the electron emission characteristics of cold cathode,such as an increasing the energy spread,so it is
                  important to study the effect of different heating currents on the emission characteristics of cold cathode for practical applica-
                  tions. In this paper,a single-crystal LaB 6  nanoneedle point electron source was fabricated by focused ion beam (FIB) milling,
                  and its electron emission characteristics were investigated at different heating temperatures. Firstly,the temperatures of the
                  cathode under different heating currents were obtained by COMSOL Multiphysics electro-thermal coupling simulation,and
                  then the experimental study of the stability of the cold field emission current was carried out under different heating tempera-


              收稿日期:2025−02−05
              基金项目:国家重点研发计划项目(2023YFF0719004);国家自然科学基金项目(62301619);广东省重点领域研发计划项目
                      (2022B0303030001); 广 州 市 基 础 与 应 用 基 础 研 究 专 题 项 目 (2024A04J4525); 中 央 高 校 基 本 科 研 业 务 费
                      (24hytd002);电子元器件可靠性物理及其应用技术国家级重点实验室专项基金项目(22D03)
              作者简介:苟明楷,硕士研究生。E-mail:goumk@mail2.sysu.edu.cn
                      黄凯,硕士,中级工程师,本文共同第一作者。E-mail:Huangkai_nwpu@qq.com
              通信作者:唐帅,博士,副教授。E-mail:tangsh58@mail.sysu.edu.cn
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