Page 171 - 《软件学报》2025年第12期
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5552                                                      软件学报  2025  年第  36  卷第  12  期


                    随着科技的不断进步, 集成电路的复杂度不断增加, 使得测试电路成本不断提高, 当集成电路在测试集的激励
                 下得到与预期不同的输出响应时, 使用基于模型的诊断方法进行分析, 从而得到集成电路的候选故障信息, 可以大
                 幅度地减少测试的成本. 除此之外, 配电网的故障诊断也尤为重要, 国家电网面积大且错综复杂, 由于硬件老化、
                 气候、人为等因素, 出现故障频率较高, 若能够在短时间内找到故障点, 防止大面积停电等事故, 可减少大量的经
                 济损失.

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