Page 237 - 《软件学报》2021年第6期
P. 237

姚广宇  等:芯片开发功能验证的形式化方法                                                            1811


             reg_signal_light_light1:=2;
             TEMP<==reg_signal_light_light1 and skip;
             every_i:=0;
             while (every_i≤2)
             {signal_light_light1[every_i]:=TEMP%2;
             every_i:=every_i+1;
             TEMP:=TEMP/2};
             reg_signal_light_light2:=2;
             TEMP<==reg_signal_light_light2 and skip;
             every_i:=0;
             while (every_i≤2)
             {signal_light_light2[every_i]:=TEMP%2;
             every_i:=every_i+1;
             TEMP:=TEMP/2}}
             else {if (reg_signal_light_state=signal_light_Idle)
             then {if (signal_light_rst≥1)
             then {reg_signal_light_state:=signal_light_S1;
             TEMP<==reg_signal_light_state and skip;
             every_i:=0;
             while (every_i≤2)
             {signal_light_state[every_i]:=TEMP%2;
             every_i:=every_i+1;
             TEMP:=TEMP/2};
             reg_signal_light_light1:=4;
             TEMP<==reg_signal_light_light1 and skip;
             every_i:=0;
             while (every_i≤2)
             {signal_light_light1[every_i]:=TEMP%2;
             every_i:=every_i+1;
             TEMP:=TEMP/2};
             reg_signal_light_light2:=1;
             TEMP<==reg_signal_light_light2 and skip;
             every_i:=0;
             while (every_i≤2)
             {signal_light_light2[every_i]:=TEMP%2;
             every_i:=every_i+1;
             TEMP:=TEMP/2}}
             else {empty}}
             else {if (reg_signal_light_state=signal_light_S1)
             then {if (reg_signal_light_count=25)
             then {reg_signal_light_state:=signal_light_S2;
             TEMP<==reg_signal_light_state and skip;
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