Page 301 - 《软件学报》2026年第7期
P. 301
2986 软件学报 2026 年第 37 卷第 7 期
可疑特征交互的效率. 在语句级缺陷定位中, 本文提出了一种约简的因果图模型, 该模型可以实现更精准的因果效
应评估. 此外, 通过在 6 个真实的 SPL 系统上与基准方法进行实验对比, 结果显示提出方法在单缺陷和多缺陷案
例中均表现出更优的缺陷定位效果, 说明了因果效应和频谱效应融合的必要性.
然而, FCS-FL 在处理大规模 SPL 系统时, 特征交互的搜索空间仍然是巨大的, 并且有必要在更大规模的系统
上来验证方法的有效性. 此外, 针对 SPL 缺陷的智能化修复同样也是一项重要且艰巨的任务, 但相关研究同样稀
缺. 在未来的工作中, 将考虑内部特征交互对特征级缺陷定位的影响, 以进一步缓和“组合爆炸”的影响. 此外, 计划
针对 SPL 缺陷定位任务, 构建更多高维且复杂的数据集, 尤其是复杂的多缺陷案例, 结合多级中介分析与正则化
建模策略以扩展 FCS-FL, 并在这些系统中进行验证. 最后, 拟针对 SPL 缺陷修复提出更有效的方法, 实现智能化
测试和调试的闭环.
References
[1] Clements PC, Northrop LM. Software Product Lines: Practices and Patterns. Boston: Addison-Wesley, 2002.
[2] Nie KM, Zhang L, Fan ZQ. Systematic literarture review of software product line variability modeling techniques. Ruan Jian Xue
Bao/Journal of Software, 2013, 24(9): 2001–2019 (in Chinese with English abstract). http://www.jos.org.cn/1000-9825/4433.htm [doi: 10.
3724/SP.J.1001.2013.04433]
[3] Xiang Y, Zhou YR, Cai SW. Integrating preference in many-objective optimal software product selection algorithm. Ruan Jian Xue Bao/
Journal of Software, 2020, 31(2): 282–301 (in Chinese with English abstract). http://www.jos.org.cn/1000-9825/5637.htm [doi: 10.13328/
j.cnki.jos.005637]
[4] Bagheri E, Gasevic D. Assessing the maintainability of software product line feature models using structural metrics. Software Quality
Journal, 2011, 19(3): 579–612. [doi: 10.1007/s11219-010-9127-2]
[5] Arrieta A, Segura S, Markiegi U, Sagardui G, Etxeberria L. Spectrum-based fault localization in software product lines. Information and
Software Technology, 2018, 100: 18–31. [doi: 10.1016/j.infsof.2018.03.008]
[6] Nguyen TT, Ngo KT, Nguyen S, Vo HD. Detecting false-passing products and mitigating their impact on variability fault localization in
software product lines. Information and Software Technology, 2023, 153: 107080. [doi: 10.1016/j.infsof.2022.107080]
[7] Nguyen TT, Zhang XY, Arcaini P, Ishikawa F, Vo HD. Automated program repair for variability bugs in software product line systems.
Journal of Systems and Software, 2025, 221: 112152. [doi: 10.1016/j.jss.2024.112152]
[8] Wong WE, Gao RZ, Li YH, Abreu R, Wotawa F. A survey on software fault localization. IEEE Trans. on Software Engineering, 2016,
42(8): 707–740. [doi: 10.1109/TSE.2016.2521368]
[9] Li XL, Wong WE, Gao RZ, Hu LH, Hosono S. Genetic algorithm-based test generation for software product line with the integration of
fault localization techniques. Empirical Software Engineering, 2018, 23(1): 1–51. [doi: 10.1007/s10664-016-9494-9]
[10] Wong WE, Debroy V, Gao RZ, Li YH. The DStar method for effective software fault localization. IEEE Trans. on Reliability, 2014,
63(1): 290–308. [doi: 10.1109/TR.2013.2285319]
[11] Nguyen TT, Ngo KT, Nguyen S, Vo HD. A variability fault localization approach for software product lines. IEEE Trans. on Software
Engineering, 2022, 48(10): 4100–4118. [doi: 10.1109/TSE.2021.3113859]
[12] Zeng MH, Wu YQ, Ye ZT, Xiong YF, Zhang X, Zhang L. Fault localization via efficient probabilistic modeling of program semantics.
In: Proc. of the 44th Int’l Conf. on Software Engineering. Pittsburgh: ACM, 2022. 958–969. [doi: 10.1145/3510003.3510073]
[13] Cleve H, Zeller A. Locating causes of program failures. In: Proc. of the 27th Int’l Conf. on Software Engineering. St. Louis: IEEE, 2005.
342–351. [doi: 10.1109/ICSE.2005.1553577]
[14] Garvin BJ, Cohen MB. Feature interaction faults revisited: An exploratory study. In: Proc. of the 22nd IEEE Int’l Symp. on Software
Reliability Engineering. Hiroshima: IEEE, 2011. 90–99. [doi: 10.1109/ISSRE.2011.25]
[15] Kuhn DR, Wallace DR, Gallo AM. Software fault interactions and implications for software testing. IEEE Trans. on Software
Engineering, 2004, 30(6): 418–421. [doi: 10.1109/TSE.2004.24]
[16] Baah GK, Podgurski A, Harrold MJ. Causal inference for statistical fault localization. In: Proc. of the 19th Int’l Symp. on Software
Testing and Analysis. Trento: ACM, 2010. 73–84. [doi: 10.1145/1831708.1831717]
[17] Siebert J. Applications of statistical causal inference in software engineering. Information and Software Technology, 2023, 159: 107198.
[doi: 10.1016/j.infsof.2023.107198]
[18] Leszak M, Perry DE, Stoll D. A case study in root cause defect analysis. In: Proc. of the 22nd Int’l Conf. on Software Engineering.
Limerick: ACM, 2000. 428–437. [doi: 10.1145/337180.337232]

