Page 4 - 《爆炸与冲击》2026年第10期
P. 4
第 46 卷 第 10 期 爆 炸 与 冲 击 Vol. 46, No. 10
2026 年 10 月 EXPLOSION AND SHOCK WAVES Oct., 2026
DOI：10.11883/bzycj-2025-0133
含缺陷装药高过载安定性的表征和评估 *
1
1
李 强 ，安 豪 ，周炜智 ，黄求安 ，王 健 ，杜 烨 1
1
3
2
（1. 中北大学机电工程学院，山西 太原 030051；
2. 北京理工大学爆炸科学与技术国家重点实验室，北京 100081；
3. 中国兵器装备集团自动化研究所有限公司，四川 绵阳 621000）
摘要： 为定量评估含缺陷装药的过载安定性，基于装药过载环境力实验装置，同时兼顾高过载压力和宽脉冲，测试
了不同缺陷的装药载荷特征值；通过量化实验装置对装药载荷特征值的影响规律，建立了装药响应行为与图像灰度的
关联机制；引入测试装置转换因子，提出了含缺陷装药的过载安定性评估模型，预测了不同缺陷装药的响应临界压力
阈值。结果表明：实验装置能够实现大于 1 GPa 的过载峰值和脉冲宽度大于 100 μs 的高冲量脉冲；随着缺陷的直径增
加，加载响应的反应等级显著升高；随着装药缺陷直径由 0 mm 增加到 12 mm，燃烧反应临界压力由 0.71 GPa 向 0.26 GPa
递减；当装药的缺陷直径达到 10 mm 时，出现爆燃反应临界压力，为 1.56 GPa；随着缺陷直径增加，爆燃反应临界压力
递减，在缺陷直径为 12 mm 时减为 1.25 GPa。运用模型预测得到反应临界压力，处于由反应最小过载压力和未反应最
大过载压力包围成的实验数据置信范围内，验证了模型的可靠性。
关键词： 含缺陷装药；高过载；大脉宽；安定性评估；响应临界压力
中图分类号： O381; TQ560.1 国标学科代码： 13035 文献标志码： A
Characterization and evaluation of stability of defective
charge under high overload
1
1
2
1
3
LI Qiang , AN Hao , ZHOU Weizhi , HUANG Qiuan , WANG Jian , DU Ye 1
（1. College of Mechatronic Engineering, North University of China, Taiyuan 030051, Shanxi, China;
2. State Key Laboratory of Explosion Science and Technology, Beijing Institute of Technology, Beijing 100081, China;
3. Automation Research Institute Co., Ltd., China South Industries Group Corporation, Mianyang 621000, Sichuan, China）
Abstract: In order to quantitatively evaluate the overload stability of charge with defects, by adjusting the material and
thickness of the waveform modulator, the waveform, amplitude, and pulse width of the loading signal were precisely
controlled, based on the overload environmental force experimental device, the eigenvalues of charge load with different
defects were measured, which can take into account the high overload pressure and wide pulse at the same time. The response
degree of the charges under investigation was quantitatively characterized based on the burn marks, damage level, and
mechanical fitting performance of the witness plates, grayscale numerical processing was applied to the surface images of the
recovered witness plates after testing, the influence of the experimental system on the eigenvalues of charge load was
quantified, and the correlation mechanism between charge response behavior and image grayscale was established. Based on
clustering analysis, the primary stimulating factors affecting the stability of the charges, including defect diameter, flyer
thickness, and the material and thickness of the waveform modulator, were classified, the corresponding conversion factors of
the test device were introduced, the evaluation model of overload stability of defective charge was constructed, and the
* 收稿日期： 2025-05-06；修回日期： 2025-07-02
基金项目： 山西省自然科学面上基金（20210302124196，202203021211097）；中北大学毁伤技术重点实验室开放研究基金
（DXMBJJ2023-04）
第一作者： 李 强（1985－ ），男，博士，副教授，liqiang1170@126.com
通信作者： 杜 烨（1979－ ），女，博士，副教授，29872858@qq.com
101001-1
